Florian Boes

Florian Boes, Research Associate, Karlsruhe Institute of Technology

Florian Boes received his master’s degree in electrical engineering from the Karlsruhe Institute of Technology (KIT), in Karlsruhe, Germany, in 2013. He is currently working as a research and teaching assistant at the Institute of radio Frequency Engineering and Electronics at the Karlsruhe Institute of Technology (KIT), where he is working towards his Ph.D. degree on ultra-broadband on-wafer measurement techniques. Currently, his main research interest focuses on diplexer and multiplexer design, as well as packaging and interconnects in the frequency range of DC-300 GHz.

Dual-band probes with broadband diplexers for 2-port measurements up to 170 GHz

In the millimeter-wave frequency range on-wafer measurements of passive and active circuits requires a highly expensive setup using a network analyzer, frequency extension modules and on-wafer measurement probes. The waveguide connecting the on-wafer probe to the extension module, as well as the extension module itself, are significant limiting factors for the achievable measurement bandwidth. Hence, a full characterization of a very broadband device under test requires an impractical multiple number of calibrations and measurements with different frequency extension modules and on-wafer probes for the different frequency ranges. One possible solution to overcome this problem is the use of novel architectures and methodologies by integrating a broadband diplexer into the on-wafer probe. Unlike conventional on-wafer probes with only one RF connector, the so-called dual band probe features a 1 mm coax and a WR-06 connector in parallel for DC-110 GHz and 110-170 GHz signals. The diplexer within the dual band probe combines the different frequency bands to one single probe tip covering the whole frequency range. Using a four-port network analyzer and two frequency extension modules for DC-110 GHz and two 110-170 GHz extension modules in combination with dual band probes enables a single setup for near-DC to 170 GHz measurement.